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Search Publications by: Aaron Hagerstrom (Fed)

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Displaying 1 - 17 of 17

Physical Models and Dimensional Traceability of 2.4 mm Coaxial Airline Standards for Determining Systematic Uncertainties of Calibrated Scattering-Parameters

July 6, 2023
Author(s)
Jeffrey Jargon, Dylan Williams, Angela Stelson, Chris Long, Aaron Hagerstrom, John R. Stoup, Eric S. Stanfield
In this report, we document the models and dimensional traceability of our 2.4 mm coaxial airline standards for performing multiline thru-reflect-line calibrations up to 50 GHz using vector network analyzers. We identify the equations used in our models of

Modeling the linear and nonlinear dielectric response of solvents

March 13, 2023
Author(s)
Michael Woodcox, Avik Mahata, Aaron Hagerstrom, Angela Stelson, Chris Muzny, Ravishankar Sundararaman, Kathleen Schwarz
We demonstrate a method to compute the dielectric spectra of fluids in molecular dynamics by directly applying electric fields to the simulation. We obtain spectra from molecular dynamics simulations with low magnitude electric fields (0.01 V/A) in

Quantifying Receiver Nonlinearities in VNA Measurements for the WR-15 Waveguide Band

March 15, 2022
Author(s)
Angela Stelson, Aaron Hagerstrom, Jeffrey Jargon, Chris Long
Scattering (S-) parameters are fundamental to numerous microwave quantities including antenna factors, microwave power, and phase. The uncertainty in S-parameter measurements is influenced by the test setup, including instrument noise, drift, position of

Updates to the traceability of mm-wave power measurements at NIST

December 17, 2021
Author(s)
Aaron Hagerstrom, Angela Stelson, Jeffrey Jargon, Chris Long
Metrological traceability helps ensure the reliability of measurements by allowing them to be compared with established international standards with well-understood uncertainties. A thorough uncertainty analysis is therefore necessary to provide traceable

Broadband, High-Frequency Permittivity Characterization for Epitaxial Ba1-xSrxTiO3 Composition-Spread Thin Films

June 24, 2021
Author(s)
Eric J. Marksz, Aaron Hagerstrom, Jasper A. Drisko, James Booth, Nate Orloff, Xiaohang Zhang, Naila Al Hasan, Justin Pearson, Ichiro Takeuchi
Next-generation millimeter-wave (> 30 GHz) telecommunications electronics must be compact, energy efficient, and have good thermal management. Tunable materials may play a role in meeting these requirements for millimeter-wave front-ends, but there are few

Local negative permittivity and topological-phase transition in polar skyrmions

October 12, 2020
Author(s)
Sujit Das, Zijian Hong, Vladimir Stoica, Mauro A. Goncalves, Yu-Tsun Shao, Eric Parsonnet, Eric J. Marksz, Sahar Saremi, Margaret McCarter, A Reynoso, Chris Long, Aaron Hagerstrom, D Meyers, V Ravi, B Prasad, H Zhou, Z Zhang, H Wen, F Gomez-Ortiz, P Garcia-Fernandez, J Bokor, J Iniguez, J Freeland, Nate Orloff, J Junquera, Long-Qing Chen, Sayeef Salahuddin, David A. Muller, L Martin, R. Ramesh
Topological solitons such as magnetic skyrmions have drawn enormous attention as stable quasi- particle-like objects. The recent discovery of polar vortices and skyrmions in ferroelectric- oxide superlattices, exhibiting exotic physical phenomena, has

Physical Models and Dimensional Traceability of WR15 Rectangular Waveguide Standards for Determining Systematic Uncertainties of Calibrated Scattering-Parameters

August 10, 2020
Author(s)
Jeffrey A. Jargon, Dylan F. Williams, Angela C. Stelson, Christian J. Long, Aaron M. Hagerstrom, Paul D. Hale, John R. Stoup, Eric S. Stanfield, Wei Ren
In this report, we document the models and dimensional traceability of our WR15 rectangular waveguide standards for performing multiline thru-reflect-line calibrations from 50 GHz to 75 GHz using vector network analyzers. We identify the equations used in

Measurements of Nonlinear Polarization Dynamics in the Tens of Gigahertz

April 9, 2020
Author(s)
Aaron Hagerstrom, Eric J. Marksz, Xiaohang Zhang, Xifeng Lu, Chris Long, James Booth, Ichiro Takeuchi, Nate Orloff
Frequency-dependent linear permittivity measurements are commonplace in the literature, providing key insights into the structure of dielectric materials. These measurements describe a material's dynamic response to a small applied electric eld. In

Materials Characterization With Multiple Offset Reflects at Frequencies to 110 GHz

January 8, 2020
Author(s)
Nina P. Basta, Aaron Hagerstrom, Jasper A. Drisko, Jim Booth, Edward Garboczi, Chris Long, Nate Orloff
Understanding the electrical properties of materials is a necessary part of any microwave circuit design. In this article, we explore the possibility of employing multiple-offset-reflect devices for on-wafer materials characterization at frequencies up to

Targeted chemical pressure yields tuneable millimetre-wave dielectric

December 23, 2019
Author(s)
Natalie M. Dawley, Eric J. Marksz, Aaron Hagerstrom, Gerhard H. Olsen, Megan E. Holtz, Jingshu Zhang, Chris Long, Craig Fennie, David A. Muller, Darrell G. Schlom, James Booth, Nate Orloff
Tunable dielectrics are key constituents for emerging high-frequency devices in telecommunications—including tunable filters, phase shifters, and baluns—and for miniaturizing frequency-agile microwave and millimeter-wave components. Today, strained films

Determining Carbon Fiber Composite Loading by Flip-Chip on a Coplanar Waveguide to 110GHz

November 22, 2018
Author(s)
Nina P. Basta, Jasper A. Drisko, Aaron M. Hagerstrom, Joshua A. Orlicki, Jennifer M. Sietins, Daniel B. Knorr, Jr., Edward J. Garboczi, Christian J. Long, Nathan D. Orloff
The electrical properties of materials are a necessary part of any circuit design. As applications at millimeter-wave frequen-cies increase, there is a growing need to develop new materials with low loss and multiple functionalities. Unfortunately, many

Determining Carbon Fiber Composite Loading with Flip-Chip Measurements to 110 GHz

September 1, 2018
Author(s)
Nina P. Basta, Aaron Hagerstrom, Jasper A. Drisko, James Booth, Edward Garboczi, Christian Long, Nathan Orloff
— Electrical properties of materials are a necessary part of any circuit design. With emerging applications at millimeter- wave frequencies, there is a need to characterize new materials before they come to market. At frequencies below about 67 GHz, it is

Sub-nanosecond Tuning of Microwave Resonators Fabricated on Ruddlesden-Popper Dielectric Thin Films

July 9, 2018
Author(s)
Aaron M. Hagerstrom, Xifeng Lu, Natalie Dawley, H. Nair, Jordi Mateu, Robert D. Horansky, Charles A. Little, James C. Booth, Christian J. Long
Voltage-tunable dielectric materials are widely used for microwave-frequency signal processing. Among tunable dielectric thin films, (SrTiO3)nSrO Ruddlesden-Popper (RP) superlattices have exceptionally low loss at high frequencies. This paper reports the

Characterization of Transmission Lines with Nonlinear Dielectric Materials

November 28, 2017
Author(s)
Aaron M. Hagerstrom, Christian J. Long, Nathan D. Orloff, James C. Booth, Eric J. Marksz
Nonlinear transmission lines are interesting for two broad reasons: first, they have several direct device applications (i.e. harmonic generation, and phase shifters), and second, they provide a way to characterize nonlinear materials at mm-wave