September 15, 2023
Author(s)
Gabriel Taylor, Anthony D. Putorti Jr., Scott Bareham, Christopher U. Brown, Wai Cheong Tam, Ryan Falkenstein-Smith, Stephen Fink, Michael Heck, Edward Hnetkovsky, Nicholas Melly, Kenneth Hamburger, Kenneth Miller
This report documents an experimental program designed to investigate high energy arcing fault (HEAF) phenomena for medium-voltage, metal-enclosed bus ducts and switchgear. This report covers full-scale laboratory experiments using representative nuclear