Jarrett, D.
and Elmquist, R.
(2004),
Settling Times of High-Value Standard Resistors, CPEM Digest, London, 1, UK, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=31606
(Accessed December 26, 2024)
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Settling Times of High-Value Standard Resistors
Published
Author(s)
,
Abstract
An investigation of the response of high-value resistance standards and elements to applied potential has showed that the processes used to prepare and construct high-value resistance standards can effect the settling times of these standards. Improvements made to the processes used at NIST to fabricate high-value resistance standards will be discussed.Proceedings Title
CPEM Digest
Conference Dates
June 27-July 2, 2004
Conference Location
London, 1, UK
Conference Title
Conference on Precision Electromagnetic Measurements
Pub Type
Conferences
Download Paper
Keywords
fabrication, measurement, settling time, standard resistor, uncertainty
Citation
Issues
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Created May 31, 2004, Updated October 12, 2021