Koo, S.
, Li, Q.
, Edelstein, M.
, Richter, C.
and Vogel, E.
(2005),
Silicon Nanowire Field Effect Transistor Test Structures Fabricated by Top-down Approaches, 2005 International Semiconductor Device Research Symposium, Bethesda, MD, USA
(Accessed July 17, 2024)
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Silicon Nanowire Field Effect Transistor Test Structures Fabricated by Top-down Approaches
Published
Author(s)
, , , ,
Conference Dates
December 7-9, 2005
Conference Location
Bethesda, MD, USA
Conference Title
2005 International Semiconductor Device Research Symposium
Pub Type
Conferences
Citation
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Created December 8, 2005, Updated October 12, 2021