Croarkin, M.
and Ehrstein, J.
(1999),
Standard Reference Materials ::The certification of 100 mm diameter silicon resistivity SRMs 2541 through 2547 using dual-configuration four-point probe measurements, 1999 edition/, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NIST.SP.260-131e2
(Accessed November 8, 2024)
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Standard Reference Materials ::The certification of 100 mm diameter silicon resistivity SRMs 2541 through 2547 using dual-configuration four-point probe measurements, 1999 edition/
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- NIST SP 260-131e2
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NIST SP 260-131e2
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NIST Pubs
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Created January 1, 1999, Updated May 20, 2023