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Statistics for Electromigration Testing

Published

Author(s)

Harry A. Schafft, J. A. Lechner, B. Sabi, M. Mahaney, R P. Smith
Proceedings Title
Proc., 26th Annual International Reliability Physics Symposium
Conference Dates
April 12-14, 1988
Conference Location
Monterey, CA, USA

Citation

Schafft, H. , Lechner, J. , Sabi, B. , Mahaney, M. and Smith, R. (1988), Statistics for Electromigration Testing, Proc., 26th Annual International Reliability Physics Symposium, Monterey, CA, USA (Accessed October 31, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created December 30, 1988, Updated October 12, 2021