Weintraub, C.
, Vogel, E.
, Hauser, J.
, Yang, N.
, Misra, V.
, Wortman, J.
, Ganem, J.
and Masson, P.
(2001),
Study of Low-Frequency Charge Pumping on Thin Stacked Dielectrics, IEEE Transactions on Electron Devices
(Accessed November 8, 2024)
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Study of Low-Frequency Charge Pumping on Thin Stacked Dielectrics
Published
Author(s)
C E. Weintraub, , John R. Hauser, Nian Yang, Veena Misra, J. J. Wortman, J J. Ganem, Pascal Masson
Citation
IEEE Transactions on Electron Devices
Volume
48
Issue
12
Pub Type
Journals
Keywords
Charge Pumping, Dielectric, Interface State Nitrogen, MOS, Tunneling
Citation
Issues
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Created November 30, 2001, Updated October 12, 2021