Richter, M.
, Woicik, J.
, Pianetta, P.
, Miyano, K.
, Kendelewicz, T.
, Bouldin, C.
, Spicer, W.
and Lindau, I.
(1991),
Surface Extended X-Ray Adsorption Fine Structure Studies of the Si(001) 2x1-Sb Interface, Journal of Vacuum Science and Technology
(Accessed December 26, 2024)
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Surface Extended X-Ray Adsorption Fine Structure Studies of the Si(001) 2x1-Sb Interface
Published
Author(s)
M. Richter, J C. Woicik, P Pianetta, K. E. Miyano, T Kendelewicz, , W E. Spicer, I. Lindau
Citation
Journal of Vacuum Science and Technology
Volume
A 9
Issue
3
Pub Type
Journals
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created May 31, 1991, Updated October 12, 2021