Vorburger, T.
, Song, J.
, Chu, W.
, , T.
, , X.
, Yen, J.
, Thompson, R.
, , R.
, Bachrach, B.
and Ols, M.
(2010),
Topography measurements for correlations of standard cartridge cases, SPIE Scanning Microscopy, Monterey, CA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=905846
(Accessed November 21, 2024)