Postek, M.
(1994),
Traceable Standards for Scanning Electron Microscopy, Proceedings of Microscopy Society of America, John Friel, Editor, Unknown, USA
(Accessed January 2, 2025)
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Traceable Standards for Scanning Electron Microscopy
Published
Author(s)
Abstract
The emphasis on International Standards Organization (ISO) certification of laboratories has resulted in a renewed interest in NIST traceable standards for scanning electron microscopy (SEM). Under ISO certification, it is mandatory to calibrate and maintain the calibration of laboratory instrumentation.Proceedings Title
Proceedings of Microscopy Society of America, John Friel, Editor
Conference Dates
January 1, 1994
Conference Location
Unknown, USA
Conference Title
Microscopy Society of America
Pub Type
Conferences
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created January 1, 1994, Updated February 19, 2017