Bieler, M.
, Struszewski, P.
, Feldman, A.
, Jargon, J.
, Hale, P.
, Gong, P.
, Xie, W.
, Yang, C.
, Feng, Z.
, Zhao, K.
and Yang, Z.
(2020),
Ultrafast waveform metrology: A first international comparison, Conference on Precision Electromagnetic Measurements, Denver, CO, US, [online], https://doi.org/10.1109/CPEM49742.2020.9191926, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=929616
(Accessed November 23, 2024)
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Ultrafast waveform metrology: A first international comparison
Published
Author(s)
Mark Bieler, Paul Struszewski, , , , Pengwei Gong, Wen Xie, Chuntao Yang, Zhigang Feng, Kejia Zhao, Zhijun Yang
Abstract
We report on the first international comparison in ultrafast waveform metrology. To this end, the frequency and time responses of a photodiode with a nominal bandwidth of 100 GHz have been measured by several National Metrology Institutes during the last two years. An overall good agreement between the different measurement techniques is obtained. However, certain features in the frequency- and time-domain responses are not reproduced by all NMIs, calling for additional studies and comparisons.Proceedings Title
Conference on Precision Electromagnetic Measurements
Conference Dates
August 24-28, 2020
Conference Location
Denver, CO, US
Pub Type
Conferences
Download Paper
Keywords
Waveform metrology, photodiodes, electro-optic sampling, ultrashort voltage pulses
Citation
Issues
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Created August 23, 2020, Updated October 12, 2021