Patrick, H.
and Zarobila, C.
(2024),
Ultraviolet to Short-Wave Infrared Spectral Reflectance, Special Publication (NIST SP), National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NIST.SP.250-101 , https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=956799
(Accessed October 31, 2024)
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Ultraviolet to Short-Wave Infrared Spectral Reflectance
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Abstract
The National Institute of Standards and Technology performs calibrations of spectral reflectance measurements in the ultraviolet (UV) to short-wave infrared (SWIR) spectral regions using the Robotic Optical Scattering Instrument (ROSI) and its associated Reference Integrating Sphere (RIS). This special publication gives a comprehensive overview of the design, operation, and capabilities of this facility. Measurement methods for spectral reflectance, the elements of the uncertainty budget, and validation of the reflectance scale through comparison with NIST's previous reference instrument, the Spectral Tri-function Automated Reference Reflectometer (STARR), are described. Examples of calibration measurements, including specular reflectance of mirrors, bidirectional reflectance of diffuse reflectors, and directional-hemispherical reflectance, are given. Examples of typical calibration reports are also provided.Citation
Special Publication (NIST SP) - 250-101
Report Number
250-101
NIST Pub Series
Pub Type
NIST Pubs
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Keywords
Bidirectional reflectance distribution function, directional-hemispherical reflectance, optical properties of materials, reflectance, reflectance factor, diffuse reflectance, spectral reflectance, specular reflectance.
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If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created October 28, 2024