Splett, J.
and Wang, C.
(2005),
Uncertainty in Reference Values for the Charpy V-notch Verification Program, Journal of Testing and Evaluation, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=50807
(Accessed January 15, 2025)
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Uncertainty in Reference Values for the Charpy V-notch Verification Program
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Author(s)
,
Abstract
We present a method for computing the combined standard uncertainty for reference values used in the Charpy machine verification program administered by the National Institute of Standards and Technology. The technique is compliant with the ISO GUM and models the between-machine bias using a Type B distribution. We demonstrate the method using actual data from the Charpy machine verification program.Citation
Journal of Testing and Evaluation
Volume
34 No 3
Pub Type
Journals
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Keywords
charpy v-notch, impact certification program, impact testing, ISO GUM, notched-bar testing, reference specimens, uncertainty
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Created May 1, 2005, Updated February 19, 2017