Flores Renteria, A.
, Saruhan, B.
, Ilavsky, J.
and Allen, A.
(2021),
USAXS-Analysis of Electron-Beam Physical Vapour Deposited Thermal Barrier Coatings and Application of Void Structure Modelling to Determine the Influence of Process Parameters on the Thermal Conductivity, Surface and Coatings Technology
(Accessed March 13, 2025)
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USAXS-Analysis of Electron-Beam Physical Vapour Deposited Thermal Barrier Coatings and Application of Void Structure Modelling to Determine the Influence of Process Parameters on the Thermal Conductivity
Published
Author(s)
A Flores Renteria, B Saruhan, ,
Citation
Surface and Coatings Technology
Pub Type
Journals
Keywords
electron beam phyaical vapor deposition, microstructure characterization, small angle x-ray scattering, thermal conductivity, tthermal barrier coatings
Citation
Issues
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Created October 12, 2021