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PUBLICATIONS

Using Incandescent Lamp Failure Levels for Assessment of the Surge Environment

Published

Author(s)

H. Bachl, Francois D. Martzloff, D. Nastasi
Proceedings Title
Proc., Electromagnetic Compatibility (EMC) Symposium
Conference Dates
February 18-20, 1997
Conference Location
Zurich, 1, SZ
Pub Type
Conferences

Download Paper

Local Download
Manufacturing systems design and analysis

Citation

Bachl, H. , Martzloff, F. and Nastasi, D. (1997), Using Incandescent Lamp Failure Levels for Assessment of the Surge Environment, Proc., Electromagnetic Compatibility (EMC) Symposium, Zurich, 1, SZ, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=11170 (Accessed January 2, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created January 31, 1997, Updated October 12, 2021