Tachikawa, K.
, Itoh, K.
, Wada, H.
, Gould, D.
, Jones, H.
, Walters, C.
, Goodrich, L.
, Ekin, J.
and Bray, S.
(1989),
VAMAS Intercomparison of Critical Current Measurement in Nb<sub>3</sub>Sn Wires, IEEE Transactions on Magnetics, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=30432
(Accessed November 23, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
VAMAS Intercomparison of Critical Current Measurement in Nb3Sn Wires
Published
Author(s)
K Tachikawa, K Itoh, H Wada, D Gould, H Jones, C R. Walters, , , S L. Bray
Citation
IEEE Transactions on Magnetics
Pub Type
Journals
Download Paper
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created February 28, 1989, Updated October 12, 2021