Yu, L.
, Cheung, K.
, Tilak, V.
, Dunne, G.
, Matocha, K.
, Campbell, J.
, Suehle, J.
and Sheng, K.
(2009),
Wafer-level Hall Measurement on SiC MOSFET, Silicon Carbide and Related Materials 2009, Nuremberg, -1, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=905438
(Accessed July 18, 2024)
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Wafer-level Hall Measurement on SiC MOSFET
Published
Author(s)
, , Vinayak Tilak, Greg Dunne, Kevin Matocha, , , Kuang Sheng
Proceedings Title
Silicon Carbide and Related Materials 2009
Conference Dates
October 11-16, 2009
Conference Location
Nuremberg
Conference Title
International Conference on Silicon Carbide and Related Materials
Pub Type
Conferences
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Citation
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If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created October 11, 2009, Updated February 19, 2017