Wight, S.
(1999),
What Do We Need to Look Out for When Doing Energy Dispersive X-Ray Analysis in the Environmental Scanning Electron Microscope?, Microscopy and Microanalysis
(Accessed March 14, 2025)
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What Do We Need to Look Out for When Doing Energy Dispersive X-Ray Analysis in the Environmental Scanning Electron Microscope?
Published
Author(s)
Abstract
Electron scattering in the environmental scanning electron microscope may contribute x-ray contamination to quantitative analysis. A series of experiments explores at what range and conditions the analyst in the real world needs to be concerned about these unwanted contributions.Citation
Microscopy and Microanalysis
Volume
5
Pub Type
Journals
Keywords
energy dispersive spectrometry, environmental SEM, quantitative analysis, scanning electron microscope
Citation
Issues
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Created August 1, 1999, Updated February 19, 2017