Trautt, Z.
, McDannald, A.
, DeCost, B.
, Joress, H.
, Kusne, A.
, Tavazza, F.
and Blanton, T.
(2024),
Workshop Report on Autonomous Methodologies for Accelerating X-ray Measurements, Special Publication (NIST SP), National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NIST.SP.1500-25, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=958560
(Accessed December 26, 2024)
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Workshop Report on Autonomous Methodologies for Accelerating X-ray Measurements
Published
Author(s)
, , , , , , Tom Blanton
Abstract
The National Institute of Standards and Technology and the International Centre for Diffraction Data co-hosted a workshop on 17-18 October 2023 to identify and prioritize the goals, challenges, and opportunities for critical and emerging technology needs within industry, with an emphasis on leveraging artificial intelligence, data-driven methodologies, and high-throughput and automated workflows for accelerating x-ray-based structural analysis for materials development and manufacturing. Participants, predominantly from industry, gathered in-person at ICDD headquarters in Newtown Square, Pennsylvania. The findings of this workshop report provide critical input for strategic planning and the convening activities serve as a kickoff for future public-private cooperation.Citation
Special Publication (NIST SP) - 1500-25
Report Number
1500-25
NIST Pub Series
Pub Type
NIST Pubs
Download Paper
Keywords
Artificial Intelligence, Machine Learning, Autonomous Laboratories, Diffraction, Materials Synthesis and Characterization, Robotics
Citation
Issues
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Created November 5, 2024