Workshop Report on Autonomous Methodologies for Accelerating X-ray Measurements

Published

November 5, 2024

Author(s)

Zachary Trautt, Austin McDannald, Brian DeCost, Howard Joress, A. Gilad Kusne, Francesca Tavazza, Tom Blanton

Abstract

The National Institute of Standards and Technology and the International Centre for Diffraction Data co-hosted a workshop on 17-18 October 2023 to identify and prioritize the goals, challenges, and opportunities for critical and emerging technology needs within industry, with an emphasis on leveraging artificial intelligence, data-driven methodologies, and high-throughput and automated workflows for accelerating x-ray-based structural analysis for materials development and manufacturing. Participants, predominantly from industry, gathered in-person at ICDD headquarters in Newtown Square, Pennsylvania. The findings of this workshop report provide critical input for strategic planning and the convening activities serve as a kickoff for future public-private cooperation.

Citation

Special Publication (NIST SP) - 1500-25

Report Number

1500-25

NIST Pub Series

Special Publication (NIST SP)

Pub Type

NIST Pubs

Download Paper

https://doi.org/10.6028/NIST.SP.1500-25

Local Download

Keywords

Artificial Intelligence, Machine Learning, Autonomous Laboratories, Diffraction, Materials Synthesis and Characterization, Robotics

Citation

Trautt, Z. , McDannald, A. , DeCost, B. , Joress, H. , Kusne, A. , Tavazza, F. and Blanton, T. (2024), Workshop Report on Autonomous Methodologies for Accelerating X-ray Measurements, Special Publication (NIST SP), National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NIST.SP.1500-25, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=958560 (Accessed November 8, 2024)