Black, D.
and Long, G.
(2004),
X-Ray Topography, Special Publication (NIST SP), National Institute of Standards and Technology, Gaithersburg, MD, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=901559
(Accessed October 31, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
X-Ray Topography
Published
Author(s)
,
Abstract
The study of the interrelationships between processing, structure and properties of materials is fundamental to the field of materials science and engineering. The need to understand the microstructure of materials has driven the development of a wide variety of x-ray based characterization techniques. While X-ray topography is a very powerful tool for the evaluation of crystals for technological applications and for many areas of crystal and thin-film growth and processing, it is perhaps less well known and, therefore, has historically been underutilized in the United States. The aim of this guide is to raise the awareness of X-ray topography and, therefore, make modern x-ray topography techniques more accessible to materials scientists who would benefit by obtaining the rich variety of microstructural information it offers. The basic principles and practical aspects of topography are discussed and demonstrated through examples to help illustrate the diverse applications of this technique.Citation
Special Publication (NIST SP) - 960-10
Report Number
960-10
NIST Pub Series
Pub Type
NIST Pubs
Download Paper
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created February 4, 2004, Updated February 19, 2017