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Mathematics & Statistics

Image & signal processing

News and Updates

Projects and Programs

Spectroscopic ellipsometry measurement of a 2D monolayer and the optical property for such a thin layer.

Optical and Optoelectronic Materials Characterization

Ongoing
Today's electronics have reached a point where sheer computation power has combined form and function as the key driver of large consumer markets. The demand for portable and pervasive electronics with greater functionality promises significant changes over the next decades in how society interacts

Metrics for Manipulation and Enhancements of Forensic Images

Completed
Image metrics and well-defined algorithms will be researched and developed to analyze and quantify the image transformation processes applied by forensic scientists in the context of latent fingerprint analysis. The research will focus on two principal aspects. Image Enhancement Tools The

Publications

Multi-frequency Antenna Metrology with Sparse Measurements

Author(s)
Marc Valdez, Angela Folz, Michael Wakin, Joshua Gordon
We examine different approaches for compressive sensing in broadband antenna radiation pattern measurements, a common tool in antenna metrology. We focus on

Software

Tools and Instruments

Large Aperture Scanner

Large Aperture Scanner

The Large Aperture Scanner (LAS) scans a radar transceiver over a 5 meter by 20 meter aperture. Image reconstruction techniques enable a three-dimensional