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Mathematics & Statistics

Image & signal processing

News and Updates

Events

Projects and Programs

Spectroscopic ellipsometry measurement of a 2D monolayer and the optical property for such a thin layer.

Optical and Optoelectronic Materials Characterization

Ongoing
Today's electronics have reached a point where sheer computation power has combined form and function as the key driver of large consumer markets. The demand for portable and pervasive electronics with greater functionality promises significant changes over the next decades in how society interacts
subnanoscale electron microscopy figure

Sub-nanoscale electron microscopy of complex nanostructures

Ongoing
The properties of advance materials are becoming ever more reliant on the ability to manipulate their chemistry and structure at very fine length scales. For example, the relevant feature sizes in state-of-the-art transistors continue to decrease, even as the complexity of the architectures employed

Publications

Autonomous bootstrapping of quantum dot devices

Author(s)
Anton Zubchenko, Danielle Middlebrooks, Torbjoern Rasmussen, Lara Lausen, Ferdinand Kuemmeth, Anasua Chatterjee, Justyna Zwolak
Semiconductor quantum dots (QDs) are a promising platform for multiple different qubit implementations, all of which are voltage controlled by programmable gate

Automation of Quantum Dot Measurement Analysis via Explainable Machine Learning

Author(s)
Daniel Schug, Tyler Kovach, Michael Wolfe, Jared Benson, Sanghyeok Park, J. P. Dodson, Joelle Corrigan, Mark Eriksson, Justyna Zwolak
The rapid development of quantum dot (QD) devices for quantum computing has necessitated more efficient and automated methods for device characterization and

Tools and Instruments

Large Aperture Scanner

Large Aperture Scanner

The Large Aperture Scanner (LAS) scans a radar transceiver over a 5 meter by 20 meter aperture. Image reconstruction techniques enable a three-dimensional