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The Structure Determination Methods Group develops and disseminates measurement science, standards, and technology for the determination of the structures of advanced materials via: standard reference materials; standard reference databases; X-ray, electron, and neutron diffraction methods; synchrotron and neutron scattering methods; and computational tools. The Group’s activities are carried out in five project areas: Diffraction Metrology, Thin Film X-ray Reflectometry, Local Structure, Phase Equilibrium Data, and Crystallographic Databases.
Ceramic Phase Equilibrium Data—Advanced ceramics and inorganic materials are critically enabling elements in devices and systems across many technology sectors, such as telecommunications and energy. The objective of this …
Crystallographic Databases—Components and devices used in a broad spectrum of technology sectors such as health care, communications, energy and electronics are manufactured from crystalline materials. The development of …
Thin Film X-Ray Reflectometry—Our goal is to develop Standard Reference Materials (SRMs) and quantitative, reproducible X-ray reflectometry (XRR) data analysis methods to enable accurate measurement of film thickness, …
Measurement and Prediction of Local Structure —Our goal is to provide analytical tools that allow measurement and prediction of local structure to enable the development of ceramic materials for electronic applications. Under this project, we …
Materials Structure and Data Group
Terrell Vanderah, Group Leader
100 Bureau Drive, M/S 8520
Gaithersburg, MD 20899