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Instruments
Analytical Electron Microscope
The Titan 80-300 is a transmission electron microscope (TEM) equipped with spectroscopic detectors to allow chemical, elemental, and other analytical measurements to be performed at high spatial resolution. Two analytical spectrometers are also present on this system: a post-column Gatan Imaging Energy Filter (GIF) and an EDAX r-TEM X-ray energy dispersive spectrometer (XEDS). It can be used in full-field imaging mode as both a conventional TEM and a phase-contrast high resolution TEM for imaging the atomic scale lattice in many materials.
Divergent Beam Diffractometer
The Divergent Beam Diffractometer (DBD) is the primary instrument at NIST used to certify powder SRMs for their X-ray diffraction properties. It is a custom-built instrument which provides a very highly-characterized angular scale in a well-controlled environment. It is a Bragg-Brentano instrument, usable with either open beam from a fine-focus copper X-ray tube, or using monochromated beam from a Ge(111) Johansson optic.