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Journal of Research (NIST JRES)

Accelerating Scientific Discovery through Computation and Visualization II

Author(s)
James S. Sims, William L. George, Steven G. Satterfield, Howard Hung, John G. Hagedorn, Peter M. Ketcham, Terence J. Griffin
This is the second in a series of articles describing a wide variety of projects at NIST that synergistically combine physical science and information science

The Visible Cement Data Set

Author(s)
Dale P. Bentz, S Mizell, Steven G. Satterfield, J E. Devaney, William L. George, Peter M. Ketcham, James R. Graham, J E. Porterfield, Daniel A. Quenard, F A. Vallee, H Sallee, E Boller, J Baruchel
With advances in X-ray microtomography, it is now possible to obtain three-dimensional representations of a material's microstructure with a voxel size of less

The State of the Art and Practice in Digital Preservation

Author(s)
K H. Lee, Oliver T. Slattery, R Lu, Xiao Tang, V R. McCrary
The goal of digital preservation is to ensure long-term access to digitally stored information. In this paper, we try to present a comprehensive survey of

Accelerating Scientific Discovery through Computation and Visualization II

Author(s)
J S. Sims, W L. George, S G. Satterfield, H K. Hung, J G. Hagedorn, P M. Ketcham, T J. Griffin, S A. Hagstrom, J C. Franiatte, Garnett W. Bryant, W Jaskolski, N S. Martys, C E. Bouldin, V Simmons, O P. Nicolas, J A. Warren, B A. Am ende, J E. Koontz, B J. Filla, V G. Pourprix, S R. Copley, R B. Bohn, A P. Peskin, Y M. Parker, J E. Devaney

The 1997 North American Interagency Intercomparison of Ultraviolet Spectroradiometers Including Narrowband Filter Radiometers

Author(s)
K Lantz, P Disterhoft, E A. Early, Ambler Thompson, J DeLuisi, J Berndt, L Harrison, P Kiedron, J Ehramjian, G Bernhard, L Cabasug, JL Robertson, W Mou, T Taylor, J Slusser, D Bigelow, B Durham, G Janson, D Hayes, M Beaubien, A Beaubien
The fourth North American Intercomparison of Ultraviolet Monitoring Spectroradiometers was held September 15 to 25, 1997 at Table Mountain outside of Boulder

Crystallographic Texture in Ceramics and Metals

Author(s)
Mark D. Vaudin
Preferred crystallographic orientation, or texture, occurs almost universally, both in natural and man-made systems. Many components and devices in electronic

Special Issue - Crystallography at NIST/NBS

Author(s)
Alan D. Mighell, Winnie K. Wong-Ng
The Centennial Celebration of the National Institute of Standards and Technology (NIST), formerly known as the National Bureau of Standards (NBS), takes place