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Journal of Research (NIST JRES)

Phase Equilibria and Crystallography of Ceramic Oxides

Author(s)
Winnie K. Wong-Ng, Robert S. Roth, Terrell A. Vanderah, H F. McMurdie
Research in phase equilibria and crystallography has been a tradition in the Ceramics Division at NIST since the early thirties. In the early years, effort was

Quasicrystals

Author(s)
John W. Cahn
The discretely diffracting aperiodic crystals termed quasicrystals, discovery at NBS in the early 1980s, have led to much interdisciplinary activity involving

Dedication to Richard D. Deslattes

Author(s)
Ernest G. Kessler, Gabrielle G. Long
On May 16, 2001, the National Institute of Standards and Technology lost a most illustrious career scientist in x-ray research. This volume is dedicated to

Comparison of Two Cryogenic Radiometers at NIST

Author(s)
Jeanne M. Houston, David J. Livigni
Two cryogenic radiometers from NIST, one from the Optical Technology Division and the other from the Optoelectronics Division, were compared at three visible

Report on the Development of the Advanced Encryption Standard (AES)

Author(s)
James R. Nechvatal, Elaine B. Barker, Lawrence E. Bassham, William E. Burr, Morris J. Dworkin, James Foti, E Roback
In 1997, the National Institute of Standards and Technology (NIST) initiated a process to select a symmetric-key encryption algorithm to be used to protect

Workshop on Texture in Electronic Applications

Author(s)
Mark D. Vaudin, Debra L. Kaiser
A two day workshop on Texture in Electronic Applications was held on October 10-11,2000 at NIST, Gaithersburg. The workshop presented an excellent forum for

The Development of Fluorescence Intensity Standards

Author(s)
Adolfas K. Gaigalas, L. Li, O. Henderson, R F. Vogt, J. Barr, G E. Marti, J. Weaver, A. Schwartz
The use of fluorescence as an analytical technique has been growing over the last 20 years. A major factor in inhibiting more rapid growth has been the

A Careful Consideration of the Calibration Concept

Author(s)
Steven D. Phillips, William T. Estler, Theodore D. Doiron, K Eberhardt, M Levenson
This paper is a detailed discussion of the technical aspects of the calibration process with emphasis on the definition of the measurand, the conditions under