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Physics

Optical physics and communications

News and Updates

Projects and Programs

Spectroscopic ellipsometry measurement of a 2D monolayer and the optical property for such a thin layer.

Optical and Optoelectronic Materials Characterization

Ongoing
Today's electronics have reached a point where sheer computation power has combined form and function as the key driver of large consumer markets. The demand for portable and pervasive electronics with greater functionality promises significant changes over the next decades in how society interacts

Optical medical imaging

Optical medical imaging technologies proliferate in academic research and yet very few translate into the clinic. Optical techniques have high spatial and spectral resolution, lends itself to portability, and inexpensive relative to conventional imaging modalities such as MRI (Magnetic Resonance

Detector-based color scale

Ongoing
The expanded uncertainty of the NIST primary color-temperature lamp-standards is 8 K ( k=2). However, both the long-term stability and the spectral distribution of the lamps can significantly change with burning time. By performing the tristimulus colorimeter calibrations against detector standards
infrared starlight

Frequency Comb Calibration of Astronomical Spectrographs

Ongoing
A powerful technique for finding exo-planets is based on measuring the tiny Doppler shifts in the light from a star that is induced by the presence of orbiting planets. While many exo-planets have been discovered using this Doppler radial velocity (RV) technique, it remains a significant technical

Publications

Foundry manufacturing of octave-spanning microcombs

Author(s)
Jizhao Zang, Haixin Liu, Travis Briles, Scott Papp
Soliton microcombs provide a chip-based, octave-spanning source for self-referencing and optical metrology. We use a silicon nitride integrated photonics

Software

HolograFREE

An electron hologram is a fringe modulated image containing the amplitude and phase information of an electron transparent object. The HolograFREE routines

Modeled integrated scatter tool (MIST)

The MIST program has been developed to provide users with a general application to model an integrated scattering system. The program performs an integration of

Tools and Instruments

Beamline 7

Beamline 7: EUV reflectometry

The NIST/DARPA EUV Reflectometry facility began in the late 1980's to make measurements of the reflectivity of EUV multilayer optics for lithography. Since then

Awards