Tools and Instruments

Displaying 1 - 24 of 24

Plot of aluminum oxide photodetector typical responsivity in the EUV.

Aluminum Oxide EUV Photodetector Transfer Standard

Aluminum oxide (Al 2O 3) photodiodes are issued by NIST as transfer standard detectors in the extreme ultraviolet spectral region (5 nm to 125 nm). Each device

Beamline 1: Degradation of EUV filters and mirrors

Beamline 1 separates a swath of light from the synchrotron into two parts. The first part is collected in Beamline 1a by a normal-incidence multilayer mirror

BL-2 with the new clean room in the back.

Beamline 2: Absolute Source-Based Radiometry

Absolute source-based radiometry is founded in the traceability of a light source’s output to measurable operational parameters. The absolute irradiance at BL-2

Beamline 3: Extended Range Monochromator for Ultraviolet and Extreme-Ultraviolet Optical Properties and Calibrations

The extended range monochromator is based on a unique design that allows illumination of the gratings in both grazing and normal incidence, thus covering the

Ping-Shine Shaw filling the ACR for liquid helium at BL-4.

Beamline 4: Ultraviolet Optical Properties and Calibrations

Beamline 4 is a general purpose radiometric beamline consists of a 2 m monochromator to disperse radiation from SURF III. An Absolute Cryogenic Radiometer (ACR)

Beamline 5: New electron beam imaging system

Beamline 5 of the Synchrotron Ultraviolet Radiation Facility is a diagnostics end-station used to determine the transverse size of the stored electron beam. The

Beamline 7: EUV reflectometry

The NIST/DARPA EUV Reflectometry facility began in the late 1980's to make measurements of the reflectivity of EUV multilayer optics for lithography. Since then

Beamline 8: Surface chemistry & durability of EUV optics

Beamline 8 is used to study the degradation of surfaces that are irradiated by EUV radiation in the presence of common outgas species. Its multilayer mirror

Bidirectional optical scattering facility

Goniometric optical scatter instrument (GOSI) The bidirectional reflectance distribution function (BRDF) quantifies the angular distribution of radiation

Center for High Accuracy Retroreflection Measurements (CHARM)

In 1993, the United States Congress directed the U.S. Department of Transportation to establish "a standard for a minimum level of retroreflectivity that must

Color and appearance metrology facility

The NIST Physical Measurement Laboratory has established the color and appearance metrology facility to support calibration services for 0°/45° colored samples

Complete hemispherical infrared laser-based reflectometer (CHILR)

A custom instrument, the Complete Hemispherical infrared Laser-based Reflectometer (CHILR), employs a gold integrating sphere and is used for the measurement of

Fourier transform infrared spectrophotometry (FTIS) facility

The Fourier transform infrared spectrophotometry (FTIS) facility serves as the measurement facility for characterizing the optical properties of materials in

Goniophotometer for specular gloss calibrations - Glossmeter

Specular gloss is the perception by an observer of the mirror-like appearance of a surface. The measurement of specular gloss consists of comparing the luminous

Infrared reference integrating sphere (IRIS)

An integrating-sphere system has been designed and constructed for the measurement of multiple optical properties in the infrared spectral range. The absolute

Normal incidence Diffuse Optical Scatter Instrument (NDOSI)

Summary The Normal incidence Diffuse Optical Scatter Instrument (NDOSI) is a new facility for measuring the hemispherical reflectance and transmittance of

Reference Integrating Sphere for Spectral Reflectance

The reference integrating sphere performs directional-hemispherical reflectance measurements of spectrally neutral, non-fluorescent samples at room temperature

Reference Transmittance Spectrophotometer (RTS)

The Reference Transmittance Spectrophotometer (RTS) is the national reference instrument for regular spectral transmittance measurements of non-fluorescent

Robotic Optical Scattering Instrument (ROSI)

ROSI performs specular and bidirectional reflectance measurements of spectrally neutral, non-fluorescent specular and diffuse samples at room temperature. It

Plot of Si photodiode typical responsivity in EUV

Si EUV Photodiode Transfer Standard

Silicon (Si) photodiodes are issued by NIST as transfer standard detectors throughout the extreme ultraviolet spectral region (5 nm to 254 nm). Each device is

Synchrotron Ultraviolet Radiation Facility SURF III

The Synchrotron Ultraviolet Radiation Facility SURF III is operated by the Optical Radiation Group as a stable light source for radiometry and research. SURF

System for infrared spectral emittance of materials

This facility enables the measurement of spectral emittance using the direct method of radiance comparison of the sample with a blackbody reference source

Transfer spectrophotometer

A Perkin-Elmer Lambda 1050 spectrophotometer is used to complement the reference reflectance and transmittance instruments. It performs this function by

NIST Ultraviolet Scale Realization Facility

Ultraviolet Scale Realization Facility UV SRF

A new facility has been commissioned to the establish ultraviolet spectral power responsivity in the air-ultraviolet spectral range between 200 nm and 400 nm