Widerhorn, S.
and Tighe, N.
(1983),
Structural reliability of yttria-doped, hot-pressed silicon nitride at elevated temperatures:, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NBS.IR.83-2664
(Accessed December 26, 2024)
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Structural reliability of yttria-doped, hot-pressed silicon nitride at elevated temperatures:
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- NBS IR 83-2664
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NBS IR 83-2664
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NIST Pubs
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Created January 1, 1983, Updated May 19, 2023