Krupka, J.
, Pietruszko, S.
, Geyer, R.
, Baker-Jarvis, J.
and Derzakowski, K.
(1996),
SEMCconductors Resistivity Measurements Using Split-Dielectric Resonator Technique, Proc., Intl. Microwave Conf. MIKON, Warsaw, 1, PL
(Accessed March 13, 2025)
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SEMCconductors Resistivity Measurements Using Split-Dielectric Resonator Technique
Published
Author(s)
Jerzy Krupka, S. Pietruszko, , , Kristof Derzakowski
Proceedings Title
Proc., Intl. Microwave Conf. MIKON
Conference Dates
May 27-30, 1996
Conference Location
Warsaw, 1, PL
Pub Type
Conferences
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created April 30, 1996, Updated October 12, 2021