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PUBLICATIONS

National Nanotechnology Initiative Interagency Workshop on Instrumentation and Metrology for Nanotechnology Grand Challenge Report

Published

Author(s)

Michael T. Postek, Richard R. Cavanagh, C M. Allocca, Douglas T. Smith, Robert D. Shull, David A. Wollman, David G. Seiler, Stephen Knight, A Diebold, Richard M. Silver, Charles W. Clark, Kevin W. Lyons, James R. Whetstone, Ronald F. Boisvert
Proceedings Title
National Nanotechnology Initiative Interagency Workshop on Instrumentation and Metrology for Nanotechnology Grand Challenge Report
Conference Dates
January 27-29, 2004
Conference Location
Gaithersburg, MD
Conference Title
National Nanotechnology Initiative Interagency Workshop on Instrumentation and Metrology for Nanotechnology
Pub Type
Conferences

Keywords

metrology, nanocharacterization, nanoelectronics, nanofabrication, nanomagnetic, nanomanufacturing, nanomechanics, nanotechnology, photonics
Manufacturing and Metrology

Citation

Postek, M. , Cavanagh, R. , Allocca, C. , Smith, D. , Shull, R. , Wollman, D. , Seiler, D. , Knight, S. , Diebold, A. , Silver, R. , Clark, C. , Lyons, K. , Whetstone, J. and Boisvert, R. (2006), National Nanotechnology Initiative Interagency Workshop on Instrumentation and Metrology for Nanotechnology Grand Challenge Report, National Nanotechnology Initiative Interagency Workshop on Instrumentation and Metrology for Nanotechnology Grand Challenge Report, Gaithersburg, MD (Accessed March 13, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created August 1, 2006, Updated February 19, 2017