Lee, K.
, Cage, M.
and Rowe, P.
(1994),
Sources of Uncertainty in a DVM-Based Measurement System for a Quantized Hall Resistance Standard, Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=15964
(Accessed January 13, 2025)