Jeffery, A.
, Elmquist, R.
, Shields, J.
, Lee, L.
, Cage, M.
, Shields, S.
and Dziuba, R.
(1998),
Determination of the Von Klitzing Constant and the Fine-Structure Constant Through a Comparison of the Quantized Hall Resistance and the Ohm Derived from the NIST Calculable Capacitor, Metrologia, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=3449
(Accessed December 22, 2024)
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Determination of the Von Klitzing Constant and the Fine-Structure Constant Through a Comparison of the Quantized Hall Resistance and the Ohm Derived from the NIST Calculable Capacitor
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, , , , , , Ronald F. Dziuba
Citation
Metrologia
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2
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Journals
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If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created May 31, 1998, Updated October 12, 2021