Meeting the Metrology Needs of the Microdisplay Industry

Published

August 31, 2000

Author(s)

Paul A. Boynton, Edward F. Kelley, John M. Libert

Abstract

Measuring the optical characteristics of microdisplays produce challenges to traditional display metrology. When using light-measuring devices to measure scenes having high contrasts or wide color variations, they suffer the effects of veiling glare or lens flare, thereby inaccurately measuring the luminance of color, especially for darker luminances. A simulated-eye-design (SED) camera is being developed to attempt to reduce unwanted light contamination by copying some of the characteristics of the human eye. A discussion of the first prototype and recent results will be presented. Adequately characterizing the reflection properties of a raw microdisplay can also prove difficult due to the presence of the haze component in the bidirectional reflectance distribution function (BRDF) and the bidirectional transmittance distribution function (BRTF). In the general case, there are a minimum of four parameters that are required to specify reflection: specular (distinct image), Lambertian, and haze with a peak and width (at a minimum). Thus, a minimum of four measurements are needed, and probably more than that to characterize reflection. Several simple techniques to better characterize reflections-- techniques that are readily accessible using simple equipment, will be reviewed: ambient reflection using the equivalent of an integrating sphere, (2) reflection of a small annulus (that allows the separation of the specular and haze peak), (3) reflection of a variable aperture source (also allows the separation of the haze peak and specular components), (4) simplified BRDF measurements avoiding the details of the peak, and (5) making CCD measurements to fully characterize the reflection properties (for those who have such equipment). Finally, the Video Electronic Standards Association (VESA) Display Metrology Committee (DMC) plans to incorporate microdisplay metrology into a future version of the Flat Panel Display Measurement (FPDM) standard will be discussed.

Proceedings Title

Proc., United Engineering Foundation Microdisplay Conference

Conference Dates

August 7-9, 2000

Conference Location

Boulder, CO, USA

Conference Title

United Engineering Foundation Microdisplay Conference

Pub Type

Conferences

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Keywords

microdisplay measurements, reflection metrology, simulated eye design

Citation

Boynton, P. , Kelley, E. and Libert, J. (2000), Meeting the Metrology Needs of the Microdisplay Industry, Proc., United Engineering Foundation Microdisplay Conference, Boulder, CO, USA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=15431 (Accessed July 17, 2024)