McMichael, R.
, Stiles, M.
, Chen, P.
and Egelhoff, W.
(1998),
Ferromagnetic Resonance Linewidth in Thin Films Coupled to NiO, Journal of Applied Physics
(Accessed March 14, 2025)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Ferromagnetic Resonance Linewidth in Thin Films Coupled to NiO
Published
Author(s)
, , P J. Chen,
Abstract
The out-of-plane angular dependence of the ferromagnetic resonance linewidth, [Δ] H, has been measured for thin magnetic films coupled to NiO and for uncoupled control films. In the control films, [Δ] is described by nearly angle-independent damping parameters. In the NiO-coupled films, however, the damping was found to depend strongly on magnetization orientation, with linewidth values comparable to the control samples at normal orientation, but several times larger when the magnetization lies in plane. The additional linewidth in the NiO-coupled films follows the angular dependence of the number of nearly degenerate spin wave modes, in agreement with the predictions of a two-magnon scattering model of damping which incorporates a spin wave dispersion relation suitable for ultrathin films.Citation
Journal of Applied Physics
Volume
83
Issue
No. 11
Pub Type
Journals
Keywords
magnetic films, parameters spin wave modes, ultra-thin films
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created June 1, 1998, Updated February 19, 2025