Woicik, J.
, Aguirre-Tostado, F.
, Herrera-Gomez, A.
, Droopad, R.
, Yu, Z.
, Schlom, D.
, Karapetrova, E.
, Zschack, P.
and Pianetta, P.
(2017),
X-Ray Absorption Fine-Structure Determination of Ferroelectric Distortion in SrtiO<sub>3</sub> Thin Films grown on Si(001), Proceedings for the EXAFS XII Conference, Malmo, 1, SW
(Accessed July 17, 2024)
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X-Ray Absorption Fine-Structure Determination of Ferroelectric Distortion in SrtiO3 Thin Films grown on Si(001)
Published
Author(s)
, F S. Aguirre-Tostado, A Herrera-Gomez, R Droopad, Z Yu, D G. Schlom, E Karapetrova, P Zschack, P Pianetta
Abstract
Polarization-dependent x-ray absorption fine structure together with x-ray diffraction have been used to study the local structure in SrTiO3 thin films grown on Si(001). Our data indicate that below a critical thickness of approximately 80 , the in-plane compressive strain imposed on the SrTiO3 layer by the Si substrate results in a tetragonal plus displacive ferroelectric distortion of the SrTiO3 unit cell.Proceedings Title
Proceedings for the EXAFS XII Conference
Conference Dates
June 21-27, 2003
Conference Location
Malmo, 1, SW
Conference Title
EXAFS Conference
Pub Type
Conferences
Keywords
ferroelectric, polarization, Ti-O, x-ray absorption
Citation
Issues
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Created February 19, 2017