Huey, B.
, Ramanujan, C.
, Bobji, M.
, Blendell, J.
, White, G.
, Szoszkiewicz, R.
and And, A.
(2004),
The Importance of Distributed Loading and Cantilever Angle in Piezo-Microscopy, Journal of Electroceramics, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=854238
(Accessed December 30, 2024)
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The Importance of Distributed Loading and Cantilever Angle in Piezo-Microscopy
Published
Author(s)
, C Ramanujan, M Bobji, , , R Szoszkiewicz, A And kulik
Citation
Journal of Electroceramics
Volume
13
Issue
1
Pub Type
Journals
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If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created September 1, 2004, Updated February 19, 2017