van Roggen, A.
, Yuwono, L.
, Zhou, H.
, Meijer, P.
and Kopanski, J.
(1990),
Permittivity Measurements on Molecular-Sized Samples, Extended Abstract, Proc., IEEE Intl. Symp. on Electrical Insulation and Dielectric Phenomena (CEIDP), Pocono Manor, PA, USA
(Accessed December 30, 2024)
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Permittivity Measurements on Molecular-Sized Samples, Extended Abstract
Published
Author(s)
A. van Roggen, L. Yuwono, , ,
Proceedings Title
Proc., IEEE Intl. Symp. on Electrical Insulation and Dielectric Phenomena (CEIDP)
Conference Dates
October 29-November 1, 1990
Conference Location
Pocono Manor, PA, USA
Pub Type
Conferences
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created November 30, 1990, Updated October 12, 2021