Richter, M.
, Woicik, J.
, Nogami, J.
, Pianetta, P.
, Baski, A.
, Kendelewicz, T.
, Bouldin, C.
, Spicer, W.
, Quate, C.
and Lindau, I.
(1990),
Surface Extended-X-Ray-Absorption Fine Structure and Scanning Tunneling Microscopy of Si(001) 2x1-Sb, Physical Review Letters
(Accessed November 8, 2024)
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Surface Extended-X-Ray-Absorption Fine Structure and Scanning Tunneling Microscopy of Si(001) 2x1-Sb
Published
Author(s)
M. Richter, J C. Woicik, J. Nogami, P Pianetta, A. A. Baski, T Kendelewicz, , W E. Spicer, C. F. Quate, I. Lindau
Citation
Physical Review Letters
Volume
65
Issue
27
Pub Type
Journals
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created December 30, 1990, Updated October 12, 2021