Schlaf, R.
, Emirov, Y.
, Bieber, J.
, Sikder, A.
, Kohlscheen, J.
, Walters, D.
, Islam, M.
, Metha, B.
, Ren, Z.
, Shofner, T.
, Rossi, B.
and Cresswell, M.
(2002),
Using Carbon Nanotube Cantilevers in Scanning Probe Metrology, Proc. Intl. Soc. for Optical Engineering (SPIE), Santa Clara, CA, USA
(Accessed November 8, 2024)
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Using Carbon Nanotube Cantilevers in Scanning Probe Metrology
Published
Author(s)
R Schlaf, Y Emirov, J A. Bieber, A Sikder, J Kohlscheen, D A. Walters, M R. Islam, B Metha, Z F. Ren, T L. Shofner, B B. Rossi,
Proceedings Title
Proc. Intl. Soc. for Optical Engineering (SPIE)
Conference Dates
March 3-8, 2002
Conference Location
Santa Clara, CA, USA
Conference Title
SPIE - The International Society for Optical Engineering
Pub Type
Conferences
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created May 31, 2002, Updated October 12, 2021