Khera, D.
, Zaghloul, M.
, Linholm, L.
and Wilson, C.
(1989),
A Neural Network Approach for Classifying Test Structure Results, Proc. ICMTS 1989, Intl. Conf. on Microelectronic Test Structures, Edinburgh, 1, UK
(Accessed November 8, 2024)
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A Neural Network Approach for Classifying Test Structure Results
Published
Author(s)
D. Khera, , ,
Proceedings Title
Proc. ICMTS 1989, Intl. Conf. on Microelectronic Test Structures
Conference Dates
March 13-14, 1989
Conference Location
Edinburgh, 1, UK
Pub Type
Conferences
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created December 30, 1989, Updated October 12, 2021