U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Physics

Optical physics and communications

News and Updates

Projects and Programs

Spectroscopic ellipsometry measurement of a 2D monolayer and the optical property for such a thin layer.

Optical and Optoelectronic Materials Characterization

Ongoing
Today's electronics have reached a point where sheer computation power has combined form and function as the key driver of large consumer markets. The demand for portable and pervasive electronics with greater functionality promises significant changes over the next decades in how society interacts
Nano-Structured Optics Laboratory

Nano-Structured Optics and Optical Surface Metrology

Ongoing
Ultra-precise optics are essential to innovations in many high-tech areas, such as scientific imaging applications ranging from microscopy to astronomy, semiconductor manufacturing, medical imaging technology, defense, homeland security, consumer products, communication and information technology
equipment

Quantum Radiometry

Ongoing
For quantum applications, it is important to generate quantum states of light and detect them with extremely high efficiency. This project explores the metrology challenges associated with precision measurement of single photon sources and detectors. The classical photonic radiometry techniques used
absolute cryogenic radiometer

Bilateral Comparison of Spectral Responsivity in the Vacuum-Ultraviolet

Completed
The last decade has seen numerous key comparisons in the field of photometry and radiometry between different national metrology institutes (NMIs) in the context of the Mutual Recognition Arrangement. At first, these comparisons were restricted to wavelengths longer than 200 nm, with just the

Publications

Foundry manufacturing of octave-spanning microcombs

Author(s)
Jizhao Zang, Haixin Liu, Travis Briles, Scott Papp
Soliton microcombs provide a chip-based, octave-spanning source for self-referencing and optical metrology. We use a silicon nitride integrated photonics

Software

Modeled integrated scatter tool (MIST)

The MIST program has been developed to provide users with a general application to model an integrated scattering system. The program performs an integration of

HolograFREE

An electron hologram is a fringe modulated image containing the amplitude and phase information of an electron transparent object. The HolograFREE routines

Tools and Instruments

Beamline 7

Beamline 7: EUV reflectometry

The NIST/DARPA EUV Reflectometry facility began in the late 1980's to make measurements of the reflectivity of EUV multilayer optics for lithography. Since then

Awards