ORCID: 0000-0002-3796-2110 (Link)
ResearcherID: B-4593-2015 (Link)
Experimental physical scientist skilled in the measurement and manipulation of semiconductor devices, nanomaterials, and subcellular biological structures. Federal science policy experience: served as Senior Policy Analyst in the White House Office of Science and Technology Policy during the Bush 43 and Obama administrations. Currently working on microfabrication and characterization of engineered defect artifacts for additive manufacturing and semiconductor device manufacturing, Standard Reference Data for surface science, and new technology infrastructure for scientific data management and interoperability.
Specialties: Electron and ion beam microscopy, especially spectroscopy in scanning and transmission electron microscopes. Electron energy-loss spectroscopy, energy-dispersive x-ray spectroscopy, multivariate statistical analysis, Monte Carlo simulation, hyperspectral imaging. Research data and software management, scholarly publishing, Other Agency program interactions and stakeholder engagement.
Gold Medal Award
Department of Commerce Gold Medal Award, for development and delivery of an AI-enhanced materials analysis system.
Gold Medal Award
Department of Commerce Gold Medal Award, for measurement science and standards in support of US capabilities in nuclear non-proliferation.
Bronze Medal Award
Department of Commerce Bronze Medal Award, for exceptional innovation in dimensional and chemical measurements at the nanoscale.
Bronze Medal Award
Department of Commerce Bronze Medal Award, for excellence in editing and publication management of articles for the Journal of Research of the National Institute of Standards and Technology.