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Michael T. Stocker (Fed)
Michael Stocker is a Physical Scientist with the Surface and Interface Metrology Group at the National Institute of Standards and Technology (NIST). He has an A.A.S. in Metrology and B.S. in Computer Science and focuses on objective measurement and analysis of firearm toolmarks. He has been with the group since 2001 and has led a variety of optics-related research projects in the following fields; semiconductor, fuel cell manufacturing, and ballistic imaging. He has extensive experience in dimensional metrology, optical microscopy methods, precision engineering, and measurement uncertainty analysis. He is currently a Technical Advisor to the Association of Firearm and Toolmark Examiners (AFTE), chair of the Quality Assurance subcommittee for the Technical Working Group for 3D Toolmark Technologies (TWG3D2T) and a member of the Novel Technology Task Group for the Firearm and Toolmark Subcommittee within NIST’s Organization of Scientific Area Committees (OSAC). His current work includes developing physical reference artifacts for calibrating and evaluating performance of 3D optical surface topography instruments in addition to studying the size and reproducibility of individualizing features on firearm toolmarking surfaces.