Pragya Shrestha

Pragya R. Shrestha is an Electrical Engineer in Advanced Electronics Group in the Nanoscale Device Characterization Division at NIST. Her previous work includes developing innovative electrical device characterization techniques for novel devices and developing highly sensitive broadband ESR (Electron Spin Resonance) technique relevant to a wide-ranging spectrum of material system. Her current focus is device and circuits characterization at low temperatures and ultra-fast time dependent measurement of device operation to understand device physics and reliability at cryogenic temperatures.

Publications

Non-resonant phase sensitive approach for time resolved microwave conductivity in photoactive thin films

February 7, 2024

Author(s)

Jasleen K Bindra, Pragya Shrestha, Sebastian Engmann, Chad Cruz, David Gundlach, Emily Bittle, Jason Campbell

Time-resolved microwave conductivity (TRMC) is a contactless technique utilized for the investigation of carrier density, transport properties, trapping

A Fully Integrated, Automatically Generated DC–DC Converter Maintaining >75% Efficiency From 398 K Down to 23 K Across Wide Load Ranges in 12-nm FinFET

January 1, 2024

Author(s)

Anhang Li, Jeongsup Lee, Prashansa Mukim, Brian Hoskins, Pragya Shrestha, David Wentzloff, David Blaauw, Dennis Sylvester, Mehdi Saligane

This paper presents a fully integrated recursive successive-approximation switched capacitor (RSC) DC-DC converter implemented using an automatic cell-based

Characterization of Noise in CMOS Ring Oscillators at Cryogenic Temperatures

July 12, 2023

Author(s)

Prashansa Mukim, Pragya Shrestha, Advait Madhavan, Nitin Prasad, Jason Campbell, Forrest Brewer, Mark Stiles, Jabez J. McClelland

Allan deviation provides a means to characterize the time-dependence of noise in oscillators and potentially identify the source characteristics. Measurements

Ultrafast ID-VG Technique for Reliable Cryogenic Device Characterization

March 21, 2023

Author(s)

Pragya Shrestha, Akin Akturk, Brian Hoskins, Advait Madhavan, Jason Campbell

An in-depth understanding of the transient operation of devices at cryogenic temperatures remains experimentally elusive. However, the impact of these

Resolving Complex Photoconductivity of Perovskite and Organic Semiconductor Films Using Phase-Sensitive Microwave Interferometry

March 2, 2023

Author(s)

Jasleen Bindra, Pragya Shrestha, Sebastian Engmann, Chad Cruz, Lea Nienhaus, Emily Bittle, Jason Campbell

Complex transient photoconductivity (Δσ) contains rich fingerprints of charge recombination dynamics in photoactive films. However, a direct measure of both

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Patents (2018-Present)

Non-Resonant Electron Spin Resonant Probe And Associated Hardware

NIST Inventors

Jason Campbell , Jason Ryan , Kin (Charles) Cheung , Robert Gougelet and Pragya Shrestha

This invention details a non-resonant probe designed to measure changes in the density of broken bonds (unpaired electrons) in materials exposed to ionizing radiation. The probe functions to excite and detect electron spin resonance transitions in these materials. Accumulated radiation dose can then

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Pragya Shrestha (Fed)

Electrical Engineer

Publications

Patents (2018-Present)