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PUBLICATIONS

Characterization of Metallic Thin Film Growth by STM

Published

Author(s)

Angela Davies, Joseph A. Stroscio, Daniel T. Pierce, John Unguris, Mark D. Stiles, Robert Celotta
Proceedings Title
Proceedings of the NIST Interagency Reports 5752
Conference Dates
May 3-4, 1995
Conference Location
Gaithersburg, MD, US
Conference Title
Workshop on Industrial Applications of Scanned Probe Microscopy
Pub Type
Conferences

Keywords

MICROSCOPY
Nanometrology

Citation

Davies, A. , Stroscio, J. , Pierce, D. , Unguris, J. , Stiles, M. and Celotta, R. (1996), Characterization of Metallic Thin Film Growth by STM, Proceedings of the NIST Interagency Reports 5752, Gaithersburg, MD, US (Accessed October 31, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created December 31, 1995, Updated October 12, 2021