Pella, P.
, Kuehner, E.
and Cassatt, W.
(1976),
Development of thin calibration standards for x-ray fluorescence analysis:, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NBS.IR.75-970
(Accessed July 27, 2024)
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Development of thin calibration standards for x-ray fluorescence analysis:
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- NBS IR 75-970
Report Number
NBS IR 75-970
Pub Type
NIST Pubs
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Created January 1, 1976, Updated May 19, 2023