Souders, T.
, Stenbakken, G.
and Engler, H.
(1998),
Efficient Testing of Electronic Devices, Computing Science and Statistics - Mining and Modeling massive Data Sets in Science, Engineering, and Business with a Subtheme in Environmental Statistics, Houston, TX, USA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32677
(Accessed October 31, 2024)
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Efficient Testing of Electronic Devices
Published
Author(s)
, , Hans Engler
Proceedings Title
Computing Science and Statistics - Mining and Modeling massive Data Sets in Science, Engineering, and Business with a Subtheme in Environmental Statistics
Volume
29
Issue
1
Conference Location
Houston, TX, USA
Conference Title
Proc. of the 29th Symposium on the Interface
Pub Type
Conferences
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Citation
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If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created August 31, 1998, Updated October 12, 2021