A High-throughput Screening System for Thermoelectric Material Exploration Based on Combinatorial Film Approach

Published

May 7, 2009

Author(s)

Makoto Otani, Evan L. Thomas, Winnie Wong-Ng, Peter K. Schenck, Nathan Lowhorn, Martin L. Green, Hiroyuki Ohguchi

Abstract

A high-throughput system that consists of a combinatorial tool (a sputtering deposition tool and a pulsed laser deposition tool) and two property screening devices, developed at NIST, was used for thermoelectric material exploration. The thermoelectric power factor (S2, S=Seebeck coefficient, electrical conductivity screening device allows us to measure electrical conductivity and Seebeck coefficient of over 1000 sample-points within 6 hours. The thermal effusivity measurement system using the frequency domain thermoreflectance technique allows us to screen thermal conductivity of combinatorial/conventional films. Illustrations of applications are provided with a Co-Sn-Ce/Si(100) film for power factor determination and with a Ba2YCu3O7/SrTiO3(100) film for thermal conductivity derivation.

Citation

Japanese Journal of Applied Physics

Volume

48

Issue

5

Pub Type

Journals

Keywords

Thermoconductivity screening tool, Combinatorial films, power factor screening tool

Citation

Otani, M. , Thomas, E. , Wong-Ng, W. , Schenck, P. , Lowhorn, N. , Green, M. and Ohguchi, H. (2009), A High-throughput Screening System for Thermoelectric Material Exploration Based on Combinatorial Film Approach, Japanese Journal of Applied Physics (Accessed July 1, 2024)