Deisenroth, D.
, Weaver, J.
, Mekhontsev, S.
, Grantham, S.
and Moylan, S.
(2025),
Laser Beam Metrology for AM-Bench 2022: Approaches, Results, and Lessons Learned, Advanced Manufacturing Series (NIST AMS), National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NIST.AMS.100-67, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=958616
(Accessed April 4, 2025)