Tulchinsky, D.
, Kelley, M.
, Bass, J.
, Unguris, J.
, Dura, J.
, Borchers, J.
, Majkrzak, C.
, Hsu, S.
, Loloee, R.
and Pratt, W.
(2000),
Magnetic depth profiling Co/Cu multilayers to investigate magnetoresistance (invited), Journal of Applied Physics, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32588
(Accessed January 13, 2025)
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Magnetic depth profiling Co/Cu multilayers to investigate magnetoresistance (invited)
Published
Author(s)
D. Tulchinsky, , J. Bass, , , , , S. Y. Hsu, R. Loloee, W. P. Pratt
Citation
Journal of Applied Physics
Volume
87
Issue
9
Pub Type
Journals
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Citation
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If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created April 30, 2000, Updated October 12, 2021